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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

★★★★★4.5 out of 5(774 reviews)
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$16.65
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Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, Pre-Owned in GOOD condition.  Book has several underlining and high-lighting.  May contain inscriptions on inside of front or back cover.Shipped with USPS Media Mail.

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📋 Product Description

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, 
Pre-Owned in GOOD condition.  Book has various underlining and high-lighting.  May contain inscriptions on inside of front or back cover.
Shipped with USPS Media Mail.

This product is ideal for anyone looking for quality Outdoor products.

📐 Specifications

SKU: 165724

Category: Outdoor > Live Plants > Perennial Plants

Original Price:$16.65 USD

Sale Price:$9.99 USD

Availability: In Stock

Condition: Brand simply-arrived

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✓ no-cost shipment on orders over $50

Standard shipment: 3-5 business days​

Express dispatch: 1-2 business days (+$9.99)

30-Day Returns: Not satisfied? Return within 30 days for a full refund.

Recommended For You

4.5
★★★★★
Based on 774 reviews
SM
Sarah Miller ✓ Verified
3 weeks ago
★★★★★
appreciate this Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,!​
So far, it is uncomplicated to use and I’m satisfied.
AW
Ashley White ✓ Verified
2 months ago
★★★★★
Five Stars for Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,
So far, it does the job and it’s fine overall.
LN
Lauren Nelson ✓ Verified
2 months ago
★★★★★
premier Purchase Ever
In daily use, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, feels okay and I’m satisfied.
WG
William Garcia ✓ Verified
1 month ago
★★★★★
Five Stars for Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,
Personally, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, is handy to use and it meets expectations.
JD
John Davidson ✓ Verified
2 months ago
★★★★★
Exactly What I Needed
In daily use, the Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, is practical which feels reasonable.